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TG-based technique for NBTI degradation and leakage optimiz..:

, In: Proceedings of the 17th IEEE/ACM international symposium on Low-power electronics and design,
Lin, Chin-Hung ; Lin, Ing-Chao ; Li, Kuan-Hui - p. 133-138 , 2011
Link: https://dl.acm.org/doi/10.5555/2016802.2016839