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A diagnostic reasoning approach to defect prediction:
, In:
Proceedings of the 24th international conference on Industrial engineering and other applications of applied intelligent systems conference on Modern approaches in applied intelligence - Volume Part II
,
Abreu, Rui
;
Gonzalez-Sanchez, Alberto
;
Van Gemund, Arjan J. C.
- p. 416-425 , 2011
Link:
https://dl.acm.org/doi/10.5555/2025816.2025859
RT T1 <cTitle>Proceedings of the 24th international conference on Industrial engineering and other applications of applied intelligent systems conference on Modern approaches in applied intelligence - Volume Part II</cTitle>: T1 <Title>A diagnostic reasoning approach to defect prediction</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2025859&Exemplar=1&LAN=DE A1 Abreu, Rui A1 Gonzalez-Sanchez, Alberto A1 Van Gemund, Arjan J. C. PB Springer-Verlag YR 2011 K1 bayes K1 defect prediction K1 diagnosis K1 program spectra K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 416 OP 425 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2025816.2025859 DO https://dl.acm.org/doi/10.5555/2025816.2025859 SF ELIB - SuUB Bremen
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