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1
Testing methods for detecting stuck-open power switches in ..:
, In:
Proceedings of the International Conference on Computer-Aided Design
,
Mu, Szu-Pang
;
Wang, Yi-Ming
;
Yang, Hao-Yu
... - p. 155-161 , 2010
Link:
https://dl.acm.org/doi/10.5555/2133429.2133460
RT T1 <cTitle>Proceedings of the International Conference on Computer-Aided Design</cTitle>: T1 <Title>Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2133460&Exemplar=1&LAN=DE A1 Mu, Szu-Pang A1 Wang, Yi-Ming A1 Yang, Hao-Yu A1 Chao, Mango C.-T. A1 Chen, Shi-Hao A1 Tseng, Chih-Mou A1 Tsai, Tsung-Ying PB IEEE Press YR 2010 K1 Hardware K1 Very large scale integration design K1 Hardware validation K1 Hardware test K1 Robustness SP 155 OP 161 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2133429.2133460 DO https://dl.acm.org/doi/10.5555/2133429.2133460 SF ELIB - SuUB Bremen
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