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1 Ergebnisse
1
A Yield and Reliability Improvement Methodology Based on Lo..:
Kurimoto, Masanori
;
Matsushima, Jun
;
Ohbayashi, Shigeki
...
ACM Transactions on Design Automation of Electronic Systems (TODAES). 17 (2012) 2 - p. 1-22 , 2012
Link:
https://dl.acm.org/doi/10.1145/2159542.2159549
RT Journal T1 <Title>A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2159549&Exemplar=1&LAN=DE A1 Kurimoto, Masanori A1 Matsushima, Jun A1 Ohbayashi, Shigeki A1 Fukui, Yoshiaki A1 Komoda, Michio A1 Tsuda, Nobuhiro PB ACM YR 2012 SN 1084-4309 SN 1557-7309 K1 Logic redundancy K1 OPC K1 critical area analysis K1 push rule K1 scan chain ordering K1 scan-FF K1 yield K1 Hardware K1 Hardware test K1 Robustness JF ACM Transactions on Design Automation of Electronic Systems (TODAES) VO 17 IS 2 SP 1 OP 22 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2159542.2159549 DO https://dl.acm.org/doi/10.1145/2159542.2159549 SF ELIB - SuUB Bremen
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