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Scan Flip-Flop Grouping to Compress Test Data and Compact T..:

Xiang, Dong ; Chen, Zhen ; Wang, Laung-Terng
ACM Transactions on Design Automation of Electronic Systems (TODAES).  17 (2012)  2 - p. 1-24 , 2012
Link: https://dl.acm.org/doi/10.1145/2159542.2159550