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1 Ergebnisse
1
Quick detection of difficult bugs for effective post-silico..:
, In:
Proceedings of the 49th Annual Design Automation Conference
,
Lin, David
;
Hong, Ted
;
Fallah, Farzan
.. - p. 561-566 , 2012
Link:
https://dl.acm.org/doi/10.1145/2228360.2228461
RT T1
Proceedings of the 49th Annual Design Automation Conference
: T1
Quick detection of difficult bugs for effective post-silicon validation
UL https://suche.suub.uni-bremen.de/peid=acm-2228461&Exemplar=1&LAN=DE A1 Lin, David A1 Hong, Ted A1 Fallah, Farzan A1 Hakim, Nagib A1 Mitra, Subhasish PB ACM YR 2012 K1 debug K1 post-silicon validation K1 quick error detection K1 verification K1 Hardware K1 Hardware validation K1 Functional verification K1 Robustness K1 Hardware test SP 561 OP 566 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2228360.2228461 DO https://dl.acm.org/doi/10.1145/2228360.2228461 SF ELIB - SuUB Bremen
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