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1 Ergebnisse
1
Cost-free scan : a low-overhead scan path design methodo..:
, In:
Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
,
Lin, Chih-Chang
;
Lee, Mike Tien-Chien
;
Marek-Sadowska, Malgorzata
. - p. 528-533 , 1995
Link:
https://dl.acm.org/doi/10.5555/224841.225107
RT T1
Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
: T1
Cost-free scan : a low-overhead scan path design methodology
UL https://suche.suub.uni-bremen.de/peid=acm-225107&Exemplar=1&LAN=DE A1 Lin, Chih-Chang A1 Lee, Mike Tien-Chien A1 Marek-Sadowska, Malgorzata A1 Chen, Kuang-Chien PB IEEE Computer Society YR 1995 K1 DFT K1 Scan design K1 Testing K1 Hardware K1 Hardware test K1 Design for testability SP 528 OP 533 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/224841.225107 DO https://dl.acm.org/doi/10.5555/224841.225107 SF ELIB - SuUB Bremen
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