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Cost-free scan : a low-overhead scan path design methodo..:

, In: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design,
Lin, Chih-Chang ; Lee, Mike Tien-Chien ; Marek-Sadowska, Malgorzata. - p. 528-533 , 1995
Link: https://dl.acm.org/doi/10.5555/224841.225107