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Design based analog testing by Characteristic Observation I..:

, In: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design,
Lindermeir, Walter M. ; Graeb, Helmut E. ; Antreich, Kurt J. - p. 620-626 , 1995
Link: https://dl.acm.org/doi/10.5555/224841.225126