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1 Ergebnisse
1
Launch-on-Shift Test Generation for Testing Scan Designs Co..:
Wu, Shianling
;
Wang, Laung-Terng
;
Wen, Xiaoqing
...
ACM Transactions on Design Automation of Electronic Systems (TODAES). 17 (2012) 4 - p. 1-16 , 2012
Link:
https://dl.acm.org/doi/10.1145/2348839.2348852
RT Journal T1 <Title>Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2348852&Exemplar=1&LAN=DE A1 Wu, Shianling A1 Wang, Laung-Terng A1 Wen, Xiaoqing A1 Jone, Wen-Ben A1 Hsiao, Michael S. A1 Li, Fangfang A1 Li, James Chien-Mo A1 Huang, Jiun-Lang PB ACM YR 2012 SN 1084-4309 SN 1557-7309 K1 Delay fault testing K1 at-speed scan testing K1 hybrid launch-on-shift K1 Hardware K1 Hardware test K1 Design for testability JF ACM Transactions on Design Automation of Electronic Systems (TODAES) VO 17 IS 4 SP 1 OP 16 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2348839.2348852 DO https://dl.acm.org/doi/10.1145/2348839.2348852 SF ELIB - SuUB Bremen
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