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1 Ergebnisse
1
ICET : a complete chip-level thermal reliability diagnos..:
, In:
Proceedings of the 33rd annual Design Automation Conference
,
Cheng, Yi-Kan
;
Teng, Chin-Chi
;
Dharchoudhury, Abhijit
.. - p. 548-551 , 1996
Link:
https://dl.acm.org/doi/10.1145/240518.240622
RT T1 <cTitle>Proceedings of the 33rd annual Design Automation Conference</cTitle>: T1 <Title>ICET : a complete chip-level thermal reliability diagnosis tool for CMOS VLSI chips</Title> UL https://suche.suub.uni-bremen.de/peid=acm-240622&Exemplar=1&LAN=DE A1 Cheng, Yi-Kan A1 Teng, Chin-Chi A1 Dharchoudhury, Abhijit A1 Rosenbaum, Elyse A1 Kang, Sung-Mo PB ACM YR 1996 K1 Hardware K1 Robustness K1 Hardware reliability K1 Hardware test K1 Applied computing K1 Physical sciences and engineering SP 548 OP 551 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/240518.240622 DO https://dl.acm.org/doi/10.1145/240518.240622 SF ELIB - SuUB Bremen
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