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1 Ergebnisse
1
Hierarchical electromigration reliability diagnosis for VLS..:
, In:
Proceedings of the 33rd annual Design Automation Conference
,
Teng, Chin-Chi
;
Cheng, Yi-Kan
;
Rosenbaum, Elyse
. - p. 752-757 , 1996
Link:
https://dl.acm.org/doi/10.1145/240518.240661
RT T1 <cTitle>Proceedings of the 33rd annual Design Automation Conference</cTitle>: T1 <Title>Hierarchical electromigration reliability diagnosis for VLSI interconnects</Title> UL https://suche.suub.uni-bremen.de/peid=acm-240661&Exemplar=1&LAN=DE A1 Teng, Chin-Chi A1 Cheng, Yi-Kan A1 Rosenbaum, Elyse A1 Kang, Sung-Mo PB ACM YR 1996 K1 Hardware K1 Robustness K1 Hardware reliability K1 Hardware test K1 Applied computing K1 Physical sciences and engineering SP 752 OP 757 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/240518.240661 DO https://dl.acm.org/doi/10.1145/240518.240661 SF ELIB - SuUB Bremen
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