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1
Dealing with IC manufacturability in extreme scaling:
, In:
Proceedings of the International Conference on Computer-Aided Design
,
Yu, Bei
;
Gao, Jhih-Rong
;
Ding, Duo
... - p. 240-242 , 2012
Link:
https://dl.acm.org/doi/10.1145/2429384.2429430
RT T1 <cTitle>Proceedings of the International Conference on Computer-Aided Design</cTitle>: T1 <Title>Dealing with IC manufacturability in extreme scaling</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2429430&Exemplar=1&LAN=DE A1 Yu, Bei A1 Gao, Jhih-Rong A1 Ding, Duo A1 Ban, Yongchan A1 Yang, Jae-seok A1 Yuan, Kun A1 Cho, Minsik A1 Pan, David Z. PB ACM YR 2012 K1 Applied computing K1 Physical sciences and engineering K1 Engineering K1 Computer-aided design K1 Arts and humanities K1 Architecture (buildings) K1 Hardware K1 Integrated circuits SP 240 OP 242 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2429384.2429430 DO https://dl.acm.org/doi/10.1145/2429384.2429430 SF ELIB - SuUB Bremen
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