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Semi-analytical techniques for substrate characterization i..:
, In:
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
,
Charbon, Edoardo
;
Gharpurey, Ranjit
;
Sangiovanni-Vincentelli, Alberto
. - p. 455-462 , 1997
Link:
https://dl.acm.org/doi/10.5555/244522.244856
RT T1 <cTitle>Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design</cTitle>: T1 <Title>Semi-analytical techniques for substrate characterization in the design of mixed-signal ICs</Title> UL https://suche.suub.uni-bremen.de/peid=acm-244856&Exemplar=1&LAN=DE A1 Charbon, Edoardo A1 Gharpurey, Ranjit A1 Sangiovanni-Vincentelli, Alberto A1 Meyer, Robert S. PB IEEE Computer Society YR 1997 K1 Green Function K1 placement K1 substrate K1 trend analysis K1 Hardware K1 Integrated circuits K1 Electronic design automation K1 Physical design (EDA) K1 Mathematics of computing K1 Mathematical analysis K1 Numerical analysis K1 Computation of transforms SP 455 OP 462 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/244522.244856 DO https://dl.acm.org/doi/10.5555/244522.244856 SF ELIB - SuUB Bremen
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