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AUDIT : Stress Testing the Automatic Way:

, In: Proceedings of the 2012 45th Annual IEEE/ACM International Symposium on Microarchitecture,
Kim, Youngtaek ; John, Lizy Kurian ; Pant, Sanjay... - p. 212-223 , 2012
Link: https://dl.acm.org/doi/10.1109/MICRO.2012.28