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Efficient characterization of TSV-to-transistor noise coupl..:

, In: Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI,
Wang, Hailang ; Asgari, Mohammad H. ; Salman, Emre - p. 71-76 , 2013
Link: https://dl.acm.org/doi/10.1145/2483028.2483064