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1 Ergebnisse
1
Overcoming post-silicon validation challenges through quick..:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Lin, David
;
Hong, Ted
;
Li, Yanjing
... - p. 320-325 , 2013
Link:
https://dl.acm.org/doi/10.5555/2485288.2485367
RT T1
Proceedings of the Conference on Design, Automation and Test in Europe
: T1
Overcoming post-silicon validation challenges through quick error detection (QED)
UL https://suche.suub.uni-bremen.de/peid=acm-2485367&Exemplar=1&LAN=DE A1 Lin, David A1 Hong, Ted A1 Li, Yanjing A1 Fallah, Farzan A1 Gardner, Donald S. A1 Hakim, Nagib A1 Mitra, Subhasish PB EDA Consortium YR 2013 K1 debug K1 post-silicon validation K1 quick error detection K1 testing K1 verification K1 Hardware K1 Hardware validation K1 Robustness K1 Hardware test SP 320 OP 325 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2485288.2485367 DO https://dl.acm.org/doi/10.5555/2485288.2485367 SF ELIB - SuUB Bremen
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