I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Machine learning-based anomaly detection for post-silicon b..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
DeOrio, Andrew ; Li, Qingkun ; Burgess, Matthew. - p. 491-496 , 2013
Link: https://dl.acm.org/doi/10.5555/2485288.2485411