Titel

Merkliste
1 Ergebnisse

Ultra-wide voltage range designs in fully-depleted silicon-..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,

Beigne, E. ; Valentian, A. ; Giraud, B.... - p. 613-618 , 2013

Link: https://dl.acm.org/doi/10.5555/2485288.2485440

RT 
T1 <cTitle>Proceedings of the Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs</Title>

UL https://suche.suub.uni-bremen.de/peid=acm-2485440&Exemplar=1&LAN=DE
				
A1 Beigne, E.
A1 Valentian, A.
A1 Giraud, B.
A1 Thomas, O.
A1 Benoist, T.
A1 Thonnart, Y.
A1 Bernard, S.
A1 Moritz, G.
A1 Billoint, O.
A1 Maneglia, Y.
A1 Flatresse, P.
A1 Noel, J. P.
A1 Abouzeid, F.
A1 Pelloux-Prayer, B.
A1 Grover, A.
A1 Clerc, S.
A1 Roche, P.
A1 Le Coz, J.
A1 Engels, S.
A1 Wilson, R.
PB EDA Consortium
YR 2013
K1 FDSOI
K1 adaptive architectures
K1 energy efficiency
K1 low voltage
K1 ultra thin body and box
K1 Hardware
K1 Emerging technologies
K1 Very large scale integration design
K1 Applied computing
K1 Physical sciences and engineering
K1 Electronics
K1 Hardware validation
SP 613
OP 618
LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2485288.2485440
DO https://dl.acm.org/doi/10.5555/2485288.2485440
SF ELIB - SuUB Bremen

Export

RefWorks (nur Desktop-Version!)
Flow (Zuerst in Flow einloggen, dann importieren)