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Scan design with shadow flip-flops for low performance over..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Sarrazin, Sébastien ; Evain, Samuel ; de Barros Naviner, Lirida Alves.. - p. 1077-1082 , 2013
Link: https://dl.acm.org/doi/10.5555/2485288.2485550