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1 Ergebnisse
1
Design for test and reliability in ultimate CMOS:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Nicolaidis, Michael
;
Anghel, Lorena
;
Zorian, Yervant
... - p. 677-682 , 2012
Link:
https://dl.acm.org/doi/10.5555/2492708.2492878
RT T1 <cTitle>Proceedings of the Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>Design for test and reliability in ultimate CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2492878&Exemplar=1&LAN=DE A1 Nicolaidis, Michael A1 Anghel, Lorena A1 Zorian, Yervant A1 Karnik, Tanay A1 Bowman, Keith A1 Tschanz, James A1 Lu, Shih-Lien A1 Tokunaga, Carlos A1 Raychowdhury, Arijit A1 Khellah, Muhammad A1 Kulkarni, Jaydeep A1 De, Vivek A1 Avresky, Dimiter PB EDA Consortium YR 2012 K1 DfR K1 DfT K1 DfY K1 single-chip massively parallel teradevice processors K1 ultimate CMOS K1 Hardware K1 Robustness K1 Hardware test K1 Emerging technologies K1 Very large scale integration design K1 Hardware validation SP 677 OP 682 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2492708.2492878 DO https://dl.acm.org/doi/10.5555/2492708.2492878 SF ELIB - SuUB Bremen
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