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1 Ergebnisse
1
A cross-layer approach for new reliability-performance trad..:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Zambelli, C.
;
Indaco, M.
;
Fabiano, M.
... - p. 881-886 , 2012
Link:
https://dl.acm.org/doi/10.5555/2492708.2492931
RT T1
Proceedings of the Conference on Design, Automation and Test in Europe
: T1
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
UL https://suche.suub.uni-bremen.de/peid=acm-2492931&Exemplar=1&LAN=DE A1 Zambelli, C. A1 Indaco, M. A1 Fabiano, M. A1 Di Carlo, S. A1 Prinetto, P. A1 Olivo, P. A1 Bertozzi, D. PB EDA Consortium YR 2012 K1 Hardware K1 Communication hardware, interfaces and storage K1 External storage K1 Integrated circuits K1 Semiconductor memory K1 Non-volatile memory K1 Robustness SP 881 OP 886 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2492708.2492931 DO https://dl.acm.org/doi/10.5555/2492708.2492931 SF ELIB - SuUB Bremen
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