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1 Ergebnisse
1
Mitigating lifetime underestimation : a system-level app..:
, In:
Proceedings of the Conference on Design, Automation and Test in Europe
,
Wu, Kai-Chiang
;
Lee, Ming-Chao
;
Marculescu, Diana
. - p. 1269-1274 , 2012
Link:
https://dl.acm.org/doi/10.5555/2492708.2493019
RT T1 <cTitle>Proceedings of the Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>Mitigating lifetime underestimation : a system-level approach considering temperature variations and correlations between failure mechanisms</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2493019&Exemplar=1&LAN=DE A1 Wu, Kai-Chiang A1 Lee, Ming-Chao A1 Marculescu, Diana A1 Chang, Shih-Chieh PB EDA Consortium YR 2012 K1 Hardware K1 Hardware test K1 Robustness K1 Hardware validation K1 Electronic design automation K1 Physical design (EDA) SP 1269 OP 1274 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2492708.2493019 DO https://dl.acm.org/doi/10.5555/2492708.2493019 SF ELIB - SuUB Bremen
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