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Asymmetry of MTJ switching and its implication to STT-RAM d..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Zhang, Yaojun ; Wang, Xiaobin ; Li, Yong.. - p. 1313-1318 , 2012
Link: https://dl.acm.org/doi/10.5555/2492708.2493031