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Reliability-driven chip-level design for high-frequency dig..:

, In: Proceedings of the 2014 on International symposium on physical design,
Yu, Shang-Tsung ; Yeh, Sheng-Han ; Ho, Tsung-Yi - p. 133-140 , 2014
Link: https://dl.acm.org/doi/10.1145/2560519.2560528