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1 Ergebnisse
1
Using adaptive read voltage thresholds to enhance the relia..:
, In:
Proceedings of the 24th edition of the great lakes symposium on VLSI
,
Papandreou, Nikolaos
;
Parnell, Thomas
;
Pozidis, Haralampos
... - p. 151-156 , 2014
Link:
https://dl.acm.org/doi/10.1145/2591513.2591594
RT T1
Proceedings of the 24th edition of the great lakes symposium on VLSI
: T1
Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems
UL https://suche.suub.uni-bremen.de/peid=acm-2591594&Exemplar=1&LAN=DE A1 Papandreou, Nikolaos A1 Parnell, Thomas A1 Pozidis, Haralampos A1 Mittelholzer, Thomas A1 Eleftheriou, Evangelos A1 Camp, Charles A1 Griffin, Thomas A1 Tressler, Gary A1 Walls, Andrew PB ACM YR 2014 K1 characterization K1 nand flash K1 signal processing K1 Hardware K1 Integrated circuits K1 Semiconductor memory SP 151 OP 156 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2591513.2591594 DO https://dl.acm.org/doi/10.1145/2591513.2591594 SF ELIB - SuUB Bremen
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