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Neighbor-cell assisted error correction for MLC NAND flash ..:

, In: The 2014 ACM international conference on Measurement and modeling of computer systems,

Cai, Yu ; Yalcin, Gulay ; Mutlu, Onur... - p. 491-504 , 2014

Link: https://dl.acm.org/doi/10.1145/2591971.2591994

RT 
T1 <cTitle>The 2014 ACM international conference on Measurement and modeling of computer systems</cTitle>: T1 <Title>Neighbor-cell assisted error correction for MLC NAND flash memories</Title>

UL https://suche.suub.uni-bremen.de/peid=acm-2591994&Exemplar=1&LAN=DE
				
A1 Cai, Yu
A1 Yalcin, Gulay
A1 Mutlu, Onur
A1 Haratsch, Erich F.
A1 Unsal, Osman
A1 Cristal, Adrian
A1 Mai, Ken
PB ACM
YR 2014
K1 ecc
K1 error correction
K1 fault tolerance
K1 nand flash memory
K1 program interference
K1 threshold voltage distribution
K1 Hardware
K1 Hardware test
K1 Memory test and repair
K1 Computer systems organization
K1 Dependable and fault-tolerant systems and networks
K1 Availability
K1 Maintainability and maintenance
K1 Computing methodologies
K1 Modeling and simulation
K1 Model development and analysis
K1 Modeling methodologies
K1 General and reference
K1 Cross-computing tools and techniques
K1 Reliability
SP 491
OP 504
LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2591971.2591994
DO https://dl.acm.org/doi/10.1145/2591971.2591994
SF ELIB - SuUB Bremen

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