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1 Ergebnisse
1
Thermal analysis and model identification techniques for a ..:
, In:
Proceedings of the conference on Design, Automation & Test in Europe
,
Beneventi, Francesco
;
Bartolini, Andrea
;
Vivet, Pascal
.. - p. 1-4 , 2014
Link:
https://dl.acm.org/doi/10.5555/2616606.2617079
RT T1
Proceedings of the conference on Design, Automation & Test in Europe
: T1
Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip
UL https://suche.suub.uni-bremen.de/peid=acm-2617079&Exemplar=1&LAN=DE A1 Beneventi, Francesco A1 Bartolini, Andrea A1 Vivet, Pascal A1 Dutoit, Denis A1 Benini, Luca PB European Design and Automation Association YR 2014 K1 Hardware K1 Integrated circuits K1 Semiconductor memory K1 Dynamic memory K1 Hardware validation K1 Computing methodologies K1 Modeling and simulation K1 Model development and analysis K1 Modeling methodologies SP 1 OP 4 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2616606.2617079 DO https://dl.acm.org/doi/10.5555/2616606.2617079 SF ELIB - SuUB Bremen
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