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Benchmarking of mask fracturing heuristics:
, In:
Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design
,
Chan, Tuck Boon
;
Gupta, Puneet
;
Han, Kwangsoo
... - p. 246-253 , 2014
Link:
https://dl.acm.org/doi/10.5555/2691365.2691415
RT T1 <cTitle>Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design</cTitle>: T1 <Title>Benchmarking of mask fracturing heuristics</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2691415&Exemplar=1&LAN=DE A1 Chan, Tuck Boon A1 Gupta, Puneet A1 Han, Kwangsoo A1 Kagalwalla, Abde Ali A1 Kahng, Andrew B. A1 Sahouria, Emile PB IEEE Press YR 2014 SP 246 OP 253 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2691365.2691415 DO https://dl.acm.org/doi/10.5555/2691365.2691415 SF ELIB - SuUB Bremen
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