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1 Ergebnisse
1
Design for low test pattern counts:
, In:
Proceedings of the 52nd Annual Design Automation Conference
,
Konuk, Haluk
;
Moghaddam, Elham
;
Mukherjee, Nilanjan
... - p. 1-6 , 2015
Link:
https://dl.acm.org/doi/10.1145/2744769.2744817
RT T1
Proceedings of the 52nd Annual Design Automation Conference
: T1
Design for low test pattern counts
UL https://suche.suub.uni-bremen.de/peid=acm-2744817&Exemplar=1&LAN=DE A1 Konuk, Haluk A1 Moghaddam, Elham A1 Mukherjee, Nilanjan A1 Rajski, Janusz A1 Solanki, Deepak A1 Tyszer, Jerzy A1 Zawada, Justyna PB ACM YR 2015 K1 design for testability K1 scan-based test K1 test data compression K1 Hardware K1 Hardware test K1 Robustness K1 Hardware validation K1 Electronic design automation K1 Physical design (EDA) SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2744769.2744817 DO https://dl.acm.org/doi/10.1145/2744769.2744817 SF ELIB - SuUB Bremen
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