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1 Ergebnisse
1
Digital circuits reliability with in-situ monitors in 28nm ..:
, In:
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition
,
Saliva, M.
;
Cacho, F.
;
Huard, V.
... - p. 441-446 , 2015
Link:
https://dl.acm.org/doi/10.5555/2755753.2755854
RT T1 <cTitle>Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition</cTitle>: T1 <Title>Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2755854&Exemplar=1&LAN=DE A1 Saliva, M. A1 Cacho, F. A1 Huard, V. A1 Federspiel, X. A1 Angot, D. A1 Benhassain, A. A1 Bravaix, A. A1 Anghel, L. PB EDA Consortium YR 2015 K1 28FullyDepleted-SOI K1 BTI K1 HCI K1 aging K1 dielectric breakdown K1 in-situ monitors K1 reliability K1 simulations K1 timing K1 Hardware K1 Robustness K1 Hardware test K1 Emerging technologies K1 Very large scale integration design K1 Hardware validation SP 441 OP 446 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2755753.2755854 DO https://dl.acm.org/doi/10.5555/2755753.2755854 SF ELIB - SuUB Bremen
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