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1 Ergebnisse
1
LVS check for photonic integrated circuits : curvilinear..:
, In:
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition
,
Cao, Ruping
;
Billoudet, Julien
;
Ferguson, John
... - p. 1253-1256 , 2015
Link:
https://dl.acm.org/doi/10.5555/2755753.2757103
RT T1 <cTitle>Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition</cTitle>: T1 <Title>LVS check for photonic integrated circuits : curvilinear feature extraction and validation</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2757103&Exemplar=1&LAN=DE A1 Cao, Ruping A1 Billoudet, Julien A1 Ferguson, John A1 Couder, Lionel A1 Cayo, John A1 Arriordaz, Alexandre A1 O'Connor, Ian PB EDA Consortium YR 2015 K1 Hardware K1 Robustness K1 Hardware test K1 Emerging technologies K1 Very large scale integration design K1 Electronic design automation K1 Physical design (EDA) SP 1253 OP 1256 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2755753.2757103 DO https://dl.acm.org/doi/10.5555/2755753.2757103 SF ELIB - SuUB Bremen
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