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1 Ergebnisse
1
Detection of asymmetric aging-critical voltage conditions i..:
, In:
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition
,
Zwerger, Michael
;
Graeb, Helmut
- p. 1269-1272 , 2015
Link:
https://dl.acm.org/doi/10.5555/2755753.2757107
RT T1 <cTitle>Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition</cTitle>: T1 <Title>Detection of asymmetric aging-critical voltage conditions in analog power-down mode</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2757107&Exemplar=1&LAN=DE A1 Zwerger, Michael A1 Graeb, Helmut PB EDA Consortium YR 2015 K1 Hardware K1 Emerging technologies K1 Very large scale integration design K1 Hardware validation K1 Electronic design automation K1 Physical design (EDA) SP 1269 OP 1272 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2755753.2757107 DO https://dl.acm.org/doi/10.5555/2755753.2757107 SF ELIB - SuUB Bremen
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