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Fault diagnosis in designs with extreme low pin test data c..:

, In: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition,
Kundu, Subhadip ; Bhattacharya, Parthajit ; Kapur, Rohit - p. 1285-1288 , 2015
Link: https://dl.acm.org/doi/10.5555/2755753.2757111