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1 Ergebnisse
1
Identifying redundant inter-cell margins and its applicatio..:
, In:
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition
,
Chung, Woohyun
;
Shim, Seongbo
;
Shin, Youngsoo
- p. 1659-1664 , 2015
Link:
https://dl.acm.org/doi/10.5555/2755753.2757196
RT T1 <cTitle>Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition</cTitle>: T1 <Title>Identifying redundant inter-cell margins and its application to reducing routing congestion</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2757196&Exemplar=1&LAN=DE A1 Chung, Woohyun A1 Shim, Seongbo A1 Shin, Youngsoo PB EDA Consortium YR 2015 K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Wire routing K1 Placement K1 Emerging technologies K1 Very large scale integration design K1 Hardware validation SP 1659 OP 1664 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/2755753.2757196 DO https://dl.acm.org/doi/10.5555/2755753.2757196 SF ELIB - SuUB Bremen
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