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Fast process variation analysis in nano-scaled technologies..:
, In:
Proceedings of the 2014 IEEE/ACM International Symposium on Nanoscale Architectures
,
Mohammadi, Hassan Ghasemzadeh
;
Gaillardon, Pierre-Emmanuel
;
Yazdani, Majid
. - p. 163-168 , 2014
Link:
https://dl.acm.org/doi/10.1145/2770287.2770327
RT T1 <cTitle>Proceedings of the 2014 IEEE/ACM International Symposium on Nanoscale Architectures</cTitle>: T1 <Title>Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2770327&Exemplar=1&LAN=DE A1 Mohammadi, Hassan Ghasemzadeh A1 Gaillardon, Pierre-Emmanuel A1 Yazdani, Majid A1 De Micheli, Giovanni PB ACM YR 2014 K1 Applied computing K1 Physical sciences and engineering K1 Electronics K1 Hardware K1 Emerging technologies K1 Very large scale integration design K1 Hardware validation SP 163 OP 168 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2770287.2770327 DO https://dl.acm.org/doi/10.1145/2770287.2770327 SF ELIB - SuUB Bremen
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