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1 Ergebnisse
1
Lifetime Reliability Enhancement of Microprocessors : Mi..:
Hong, Hyejeong
;
Lim, Jaeil
;
Lim, Hyunyul
.
ACM Computing Surveys (CSUR). 48 (2015) 1 - p. 1-25 , 2015
Link:
https://dl.acm.org/doi/10.1145/2785988
RT Journal T1
Lifetime Reliability Enhancement of Microprocessors : Mitigating the Impact of Negative Bias Temperature Instability
UL https://suche.suub.uni-bremen.de/peid=acm-2785988&Exemplar=1&LAN=DE A1 Hong, Hyejeong A1 Lim, Jaeil A1 Lim, Hyunyul A1 Kang, Sungho PB ACM YR 2015 SN 0360-0300 SN 1557-7341 K1 Negative bias temperature instability K1 microprocessor K1 performance and reliability K1 Hardware K1 Very large scale integration design K1 VLSI system specification and constraints K1 Software and its engineering K1 Software organization and properties K1 Contextual software domains K1 Operating systems K1 Process management JF ACM Computing Surveys (CSUR) VO 48 IS 1 SP 1 OP 25 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2785988 DO https://dl.acm.org/doi/10.1145/2785988 SF ELIB - SuUB Bremen
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