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1 Ergebnisse
1
Effective Cross Comparison of Mismatch Effects on Different..:
, In:
Proceedings of the 28th Symposium on Integrated Circuits and Systems Design
,
de Oliveira, Ewerton Gomes
;
de Moraes Cruz, Carlos Augusto
;
de Lima Monteiro, Davies William
- p. 1-2 , 2015
Link:
https://dl.acm.org/doi/10.1145/2800986.2801007
RT T1
Proceedings of the 28th Symposium on Integrated Circuits and Systems Design
: T1
Effective Cross Comparison of Mismatch Effects on Different Logarithmic Pixel Sensor Topologies
UL https://suche.suub.uni-bremen.de/peid=acm-2801007&Exemplar=1&LAN=DE A1 de Oliveira, Ewerton Gomes A1 de Moraes Cruz, Carlos Augusto A1 de Lima Monteiro, Davies William PB ACM YR 2015 K1 Active pixel sensor K1 CMOS image sensor K1 Fixed-Pattern Noise K1 Wide Dynamic Range K1 Hardware K1 Hardware validation K1 Functional verification K1 Simulation and emulation SP 1 OP 2 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2800986.2801007 DO https://dl.acm.org/doi/10.1145/2800986.2801007 SF ELIB - SuUB Bremen
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