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Pairwise Proximity-Based Features for Test Escape Screening:

, In: Proceedings of the IEEE/ACM International Conference on Computer-Aided Design,
Lin, Fan ; Hsu, Chun-Kai ; Busetto, Alberto Giovanni. - p. 300-306 , 2015
Link: https://dl.acm.org/doi/10.5555/2840819.2840862