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Reducing locating sequences for testing from finite state m..:

, In: Proceedings of the 31st Annual ACM Symposium on Applied Computing,
Jourdan, Guy-Vincent ; Ural, Hasan ; Yenigün, Hüsnü - p. 1654-1659 , 2016
Link: https://dl.acm.org/doi/10.1145/2851613.2851831