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1 Ergebnisse
1
A defect-tolerant and fully testable PLA:
, In:
Proceedings of the 25th ACM/IEEE Design Automation Conference
,
Wehn, N.
;
Glesner, M.
;
Caesar, K.
.. - p. 22-33 , 1988
Link:
https://dl.acm.org/doi/10.5555/285730.285735
RT T1 <cTitle>Proceedings of the 25th ACM/IEEE Design Automation Conference</cTitle>: T1 <Title>A defect-tolerant and fully testable PLA</Title> UL https://suche.suub.uni-bremen.de/peid=acm-285735&Exemplar=1&LAN=DE A1 Wehn, N. A1 Glesner, M. A1 Caesar, K. A1 Mann, P. A1 roth, A. PB IEEE Computer Society Press YR 1988 K1 Hardware K1 Integrated circuits K1 Logic circuits K1 Combinational circuits K1 Robustness SP 22 OP 33 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/285730.285735 DO https://dl.acm.org/doi/10.5555/285730.285735 SF ELIB - SuUB Bremen
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