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1 Ergebnisse
1
Physics-based full-chip TDDB assessment for BEOL interconne..:
, In:
Proceedings of the 53rd Annual Design Automation Conference
,
Huang, Xin
;
Sukharev, Valeriy
;
Qi, Zhongdong
.. - p. 1-6 , 2016
Link:
https://dl.acm.org/doi/10.1145/2897937.2898062
RT T1 <cTitle>Proceedings of the 53rd Annual Design Automation Conference</cTitle>: T1 <Title>Physics-based full-chip TDDB assessment for BEOL interconnects</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2898062&Exemplar=1&LAN=DE A1 Huang, Xin A1 Sukharev, Valeriy A1 Qi, Zhongdong A1 Kim, Taeyoung A1 Tan, Sheldon X.-D. PB ACM YR 2016 K1 Hardware K1 Hardware validation SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2897937.2898062 DO https://dl.acm.org/doi/10.1145/2897937.2898062 SF ELIB - SuUB Bremen
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