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1 Ergebnisse
1
Physical Design Solutions to Tackle FEOL/BEOL Degradation i..:
, In:
Proceedings of the 2016 International Symposium on Low Power Electronics and Design
,
Ku, Bon Woong
;
Debacker, Peter
;
Milojevic, Dragomir
... - p. 76-81 , 2016
Link:
https://dl.acm.org/doi/10.1145/2934583.2934622
RT T1 <cTitle>Proceedings of the 2016 International Symposium on Low Power Electronics and Design</cTitle>: T1 <Title>Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2934622&Exemplar=1&LAN=DE A1 Ku, Bon Woong A1 Debacker, Peter A1 Milojevic, Dragomir A1 Raghavan, Praveen A1 Verkest, Diederik A1 Thean, Aaron A1 Lim, Sung Kyu PB ACM YR 2016 K1 FEOL/BEOL Degradation K1 Gate-level Monolithic 3D IC K1 Low Temperature Manufacturing Process K1 Hardware K1 Electronic design automation K1 Physical design (EDA) K1 Emerging technologies K1 Very large scale integration design K1 Applied computing K1 Physical sciences and engineering K1 Electronics SP 76 OP 81 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2934583.2934622 DO https://dl.acm.org/doi/10.1145/2934583.2934622 SF ELIB - SuUB Bremen
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