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Fast physics-based electromigration checking for on-die pow..:

, In: Proceedings of the 35th International Conference on Computer-Aided Design,
Chatterjee, Sandeep ; Sukharev, Valeriy ; Najm, Farid N. - p. 1-8 , 2016
Link: https://dl.acm.org/doi/10.1145/2966986.2967041