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1 Ergebnisse
1
Applying combinatorial test data generation to big data app..:
, In:
Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering
,
Li, Nan
;
Lei, Yu
;
Khan, Haider Riaz
.. - p. 637-647 , 2016
Link:
https://dl.acm.org/doi/10.1145/2970276.2970325
RT T1
Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering
: T1
Applying combinatorial test data generation to big data applications
UL https://suche.suub.uni-bremen.de/peid=acm-2970325&Exemplar=1&LAN=DE A1 Li, Nan A1 Lei, Yu A1 Khan, Haider Riaz A1 Liu, Jingshu A1 Guo, Yun PB ACM YR 2016 K1 Adaptive Input Domain Model K1 Big Data Testing K1 Combinatorial Testing K1 Input Domain Model K1 Test Data Generation K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 637 OP 647 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2970276.2970325 DO https://dl.acm.org/doi/10.1145/2970276.2970325 SF ELIB - SuUB Bremen
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