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1 Ergebnisse
1
Greedy combinatorial test case generation using unsatisfiab..:
, In:
Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering
,
Yamada, Akihisa
;
Biere, Armin
;
Artho, Cyrille
.. - p. 614-624 , 2016
Link:
https://dl.acm.org/doi/10.1145/2970276.2970335
RT T1 <cTitle>Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering</cTitle>: T1 <Title>Greedy combinatorial test case generation using unsatisfiable cores</Title> UL https://suche.suub.uni-bremen.de/peid=acm-2970335&Exemplar=1&LAN=DE A1 Yamada, Akihisa A1 Biere, Armin A1 Artho, Cyrille A1 Kitamura, Takashi A1 Choi, Eun-Hye PB ACM YR 2016 K1 Combinatorial testing K1 SAT solving K1 test case generation K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 614 OP 624 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/2970276.2970335 DO https://dl.acm.org/doi/10.1145/2970276.2970335 SF ELIB - SuUB Bremen
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