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1 Ergebnisse
1
Quantitative analysis of measurement overhead for integrity..:
, In:
Proceedings of the Symposium on Applied Computing
,
Son, Juhyung
;
Koo, Sungmin
;
Choi, Jongmoo
... - p. 1528-1533 , 2017
Link:
https://dl.acm.org/doi/10.1145/3019612.3019738
RT T1 <cTitle>Proceedings of the Symposium on Applied Computing</cTitle>: T1 <Title>Quantitative analysis of measurement overhead for integrity verification</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3019738&Exemplar=1&LAN=DE A1 Son, Juhyung A1 Koo, Sungmin A1 Choi, Jongmoo A1 Choi, Seong-je A1 Baek, Seungjae A1 Jeon, Gwangil A1 Park, Jun-Hyeok A1 Kim, Hyoungchun PB ACM YR 2017 K1 batch extend K1 core measurement K1 integrity K1 measurement overhead K1 verification K1 Software and its engineering K1 Software organization and properties K1 Contextual software domains K1 Operating systems K1 Software creation and management K1 Software verification and validation SP 1528 OP 1533 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3019612.3019738 DO https://dl.acm.org/doi/10.1145/3019612.3019738 SF ELIB - SuUB Bremen
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