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Boosting the Performance of 3D Charge Trap NAND Flash with ..:
, In:
Proceedings of the 54th Annual Design Automation Conference 2017
,
Chen, Shuo-Han
;
Chen, Yen-Ting
;
Wei, Hsin-Wen
. - p. 1-6 , 2017
Link:
https://dl.acm.org/doi/10.1145/3061639.3062209
RT T1
Proceedings of the 54th Annual Design Automation Conference 2017
: T1
Boosting the Performance of 3D Charge Trap NAND Flash with Asymmetric Feature Process Size Characteristic
UL https://suche.suub.uni-bremen.de/peid=acm-3062209&Exemplar=1&LAN=DE A1 Chen, Shuo-Han A1 Chen, Yen-Ting A1 Wei, Hsin-Wen A1 Shih, Wei-Kuan PB ACM YR 2017 K1 3D NAND flash K1 flash storage K1 hot/cold identification SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3061639.3062209 DO https://dl.acm.org/doi/10.1145/3061639.3062209 SF ELIB - SuUB Bremen
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