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1 Ergebnisse
1
Large European programs in microelectronic system and circu..:
, In:
Proceedings of the conference on Design, automation and test in Europe
,
Dewilde, Patrick
- p. 143-es , 1999
Link:
https://dl.acm.org/doi/10.1145/307418.307600
RT T1 <cTitle>Proceedings of the conference on Design, automation and test in Europe</cTitle>: T1 <Title>Large European programs in microelectronic system and circuit design</Title> UL https://suche.suub.uni-bremen.de/peid=acm-307600&Exemplar=1&LAN=DE A1 Dewilde, Patrick PB ACM YR 1999 K1 Hardware K1 Robustness K1 Integrated circuits K1 Logic circuits SP 143 OP es LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/307418.307600 DO https://dl.acm.org/doi/10.1145/307418.307600 SF ELIB - SuUB Bremen
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