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1 Ergebnisse
1
Optimization of WEDM Process Parameters for Monocrystalline..:
, In:
Proceedings of the 2017 International Conference on Artificial Intelligence, Automation and Control Technologies
,
Yu-long, Chen
;
Hu, Huang
;
Shu-juan, Li
. - p. 1-6 , 2017
Link:
https://dl.acm.org/doi/10.1145/3080845.3080875
RT T1 <cTitle>Proceedings of the 2017 International Conference on Artificial Intelligence, Automation and Control Technologies</cTitle>: T1 <Title>Optimization of WEDM Process Parameters for Monocrystalline Silicon by Response Surface Method and Genetic Algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3080875&Exemplar=1&LAN=DE A1 Yu-long, Chen A1 Hu, Huang A1 Shu-juan, Li A1 Zhong-hao, Gu PB ACM YR 2017 K1 genetic algorithm K1 response surface methodology K1 scanning electron microscopic K1 surface quality K1 wire electrical discharge machining SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3080845.3080875 DO https://dl.acm.org/doi/10.1145/3080845.3080875 SF ELIB - SuUB Bremen
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