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1 Ergebnisse
1
IC test using the energy consumption ratio:
, In:
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
,
Jiang, Wanli
;
Vinnakota, Bapiraju
- p. 976-981 , 1999
Link:
https://dl.acm.org/doi/10.1145/309847.310109
RT T1 <cTitle>Proceedings of the 36th annual ACM/IEEE Design Automation Conference</cTitle>: T1 <Title>IC test using the energy consumption ratio</Title> UL https://suche.suub.uni-bremen.de/peid=acm-310109&Exemplar=1&LAN=DE A1 Jiang, Wanli A1 Vinnakota, Bapiraju PB ACM YR 1999 K1 Hardware K1 Robustness K1 Hardware test K1 Hardware reliability SP 976 OP 981 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/309847.310109 DO https://dl.acm.org/doi/10.1145/309847.310109 SF ELIB - SuUB Bremen
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